手套箱型氙灯稳态I-V测试仪设备主要配置有光源控制系统、电源控制系统、测试系统、恒温系统、红外测温探头、参考电池、计算机、显示器等。

光源类型

Light type

氙灯稳态光源

Xenon Lamp

冷却方式

Cooling

定制风冷

Forced air cooling

光源寿命

Light source lifetime

＞1000h

＞1000h

光谱范围

Spectrum wavelength

300-1200nm

300-1200nm

光源等级

Classfication of light source

光谱匹配度  0.875-1.125 A+

辐照度不均匀度  ≤2% A

辐照度不稳定度  ≤1% A+

Spectral match is 0.875-1.125, class   A+

Irradiance non-uniformity is ≤2%,  class   A

Irradiance instability is ≤1%,  class   A+

辐照度范围

Irradiance intensity

200W/㎡~1200W/㎡

200W/㎡~1200W/㎡

测试面积

Illumination area

 200*200mm 240*240mm

 300*300mm 320*320mm

 可定制其他尺寸

 200*200mm 240*240mm

 300*300mm 320*320mm

 Other size can be customized

测试模式  

Test mode

稳态测试模式可自由设定由1s到连续照光

Under steady-state mode, it can be set freely from 1s to continuous illumination. Besides

多通道设计

Multi-channel testing design

可实现36通道同时测试，通道数量可定制

36 channels can be tested simultaneously, and the number of channels can be customized

测试技术

Testing technology

标配I-V、V-I扫描方式，具备MPPT（最大功率点追踪）、I-t（定电压）等多种测试技术，可通过软件切换，同时集成逐点扫描方式（满足最短≤0.2s步进的扫描方式）

It equipped with I-V, V-I scanning, MPPT (maximum power point tracking), I-t (constant voltage) and other test technologies, all these technologies can be switched by software.  It also equipped point-by-point scanning ( meet the shortest scanning in step of ≤0.2s

测试电池

Measurable cell type

多晶、单晶、Topcon、BC、异质结、CIGS、GaAs、CdTe、钙钛矿、钙钛矿叠层等

Poly-crystalline, Mono-crystalline, TopCon, HJT, BC,CIGS, GaAs, CdTe and Perovskite

可增配项

Optional service

 集成温控系统，实现温度系数测试

 集成EL测试系统，实现同工位IV/EL测试

 可定制0BB测试工装、钙钛矿适配工装

 集成IR红外热像仪，实现热斑测试

 手套箱（米开罗那）

 Temperature Chamber can be integrated

   to achieve measurement of temperature

   coefficient

 EL testing system can achieve IV and EL

   testing at a same production section

 Jigs for 0BB cells and perovskite can be

   customized.

 Integrated with IR infrared thermal imager

   to realize heat spot testing

 Glove box（MIKROUNA）